 |
Scanning Acoustic Microscopy
(C-SAM) |
|
Mos-Aid Memory Testing (Bit Mapping) |
|
Navigation & CAD Tools for Circuit
Layout Tracing |
|
E-Beam Testing & Microcircuit Isolation
|
|
Front Side & Back Side Emission
Microscopy (EMMI) |
|
Front Side & Back Side IR Emission
Microscopy (IR-EMMI) |
|
Optical Beam Induced Resistance Change
(OBIRCH) |
|
Voltage Contrast (VC) |
|
Resistive Contrast Imaging (RCI) |
|
Time Domain Reflectometry (TDR) |
|
Nano probing system for transistor level diagnosis |
|
X-Ray for non-invasive package/assembly analysis |
關於台積公司
