Excellent power, performance and area benefit; proven process maturity
Smartphone applications are one of the main forces driving silicon technology advances. TSMC’s 7nm (N7) technology delivers up to a 30% speed improvement, a 55% power saving, and 3 times the logic density, compared to 16nm (N16). N7 technology has been widely adopted for high-performance computing (HPC), smartphones, automotive, and other applications. The extreme ultra-violet (EUV) lithography improves logic density and backward compatibility.
The N7+ node was TSMC’s first EUV process to enter volume production. EUV simplifies the process flow by requiring fewer masking layers and providing better process variation control.
The 6nm (N6) technology utilizes additional EUV layers to improve process simplicity, shorten cycle times, and improve productivity. N6 provides improvements in power, performance, and density over N7 with similar defect density thanks to a smaller standard cell library.
Through lithography process optimization, optical proximity correction (OPC), and etch co-optimization, N6 provides backward-compatible design rules, device models, and IP as N7, making the migration from N7 to N6 very straightforward. It also shares the same design flow and EDA tool availability.
Designers can adopt N6 while sustaining their N7 investments. In re-tape-out (RTO), the die size remains the same as N7, but yield improves because of a reduced number of masks and a simplified process. New tape-outs (NTO) yield improvements result from both die size reduction, denser standard cells, and EUV mask reduction. The N6 node has been in volume production since 2020. Both N7 and N6 are widely adopted in HPC devices.