Excellent power, performance, and area benefit; proven process maturity
TSMC’s 7nm (N7) technology delivers up to a 30% speed improvement, a 55% power saving, and 3 times logic density improvement over 16nm (N16). N7 technology has been widely adopted for high-performance computing (HPC), smartphones, automotive, and other applications.
Extreme ultra-violet (EUV) lithography improves logic density and backward compatibility
The N7+ node was TSMC’s first EUV process to enter volume production. EUV simplifies the process flow by requiring fewer masking layers and providing better process variation control.
The 6nm (N6) technology utilizes additional EUV layers to improve process simplicity, shorten cycle times, and improve productivity. N6 provides improvements in power, performance, and density over N7 with similar defect density thanks to a smaller standard cell library.
Through lithography process optimization, optical proximity correction (OPC), and etch co-optimization, N6 provides backward-compatible design rules, device models, and IP as N7, making the migration from N7 to N6 very straightforward. It also shares the same design flow and EDA tool availability. The N6 node has been in volume production since 2020.
Both N7 and N6 are widely adopted for mainstream 5G smartphone products.